Obsnap Instruments Sdn Bhd
29A, Jalan SS 15/4C,
47500 Subang Jaya,
Selangor, Malaysia.
+603-5621 5786
+603-5621 5829

Xavis - XSCAN-H160-OCT

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Xavis - XSCAN-H160-OCT Non-destructive Testing System - X-Ray Testing Material Testing

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Application

  • PCB, SMT, LED, Semiconductor, LCD, Automotive, Battery
  • μBGA ,BGA, CSP, ACF, Flip-Chip ,FPCB etc

Specifications

Tube Type Open
Focal Spot Size 2.0/0.9㎛
Min. Detectability 0.7㎛
Max. Output Power BE Target : 10W, Diamond Target : 23W
X-Ray Detector 5 inch Flat Panel Detector (2352x2944 pixels)
Detector Tilt Angle 60˚
Table Rotation 360˚
Table size (=Inspection Area) 525 x 540 mm
Max. Sample Loading 5kg
Manipulator 7-Axis (X1, Y1, X2, Y2, Z, Detector Tilt, Table Rotation)
X-Ray Leakage Dose 1uSv/hour
Dimension (WxDxH mm) 1700 x 1700 x 1800
Equipment Weight(kg) 3500kg
Power Supply 220 VAC Single phase 50/60Hz
Remarks CT & 3D

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