Obsnap Instruments Sdn Bhd
29A, Jalan SS 15/4C,
47500 Subang Jaya,
Selangor, Malaysia.
+603-5621 5786
+603-5621 5829

Xavis - XSCAN-A100

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Xavis - XSCAN-A100 Non-destructive Testing System - X-Ray Testing Material Testing

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Application

  • PCB, PCBA Surface Mounted Board, MLB, ect.
  • μBGA, BGA, CSP, ACF, Flip-Chip, FPCB
  • Semiconductor Chip, Fine Pitch Electronic Components, etc.
  • Engineering Plastic Injection Molding, Camera Module, etc.
  • Rechargeable Batteries (incl. EV & ESS

Specifications
Focal Spot Size 5㎛
Voltage/Current 100kV / 250uA
Magnification x214 / x429
X-Ray Detector FPD (Flat Panel Detector)
Detector Tilt Angle Tilt 50˚
Manipulator Basic] 4-Axis (X, Y, Z, Detector Tilt) / Option] Cone Beam CT Rotation
Table size (=Inspection Area) 500 x 500 mm
Max. Sample Loading 5kg
X-Ray Leakage Dose 1uSv/hour
Dimension (WxDxH mm) 1360 x 1440 x 1700
Equipment Weight(kg) 1400kg
Power Supply 220 VAC Single phase 50/60Hz
Remarks Option] Cone Beam CT&3D / Rotation Table

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