Obsnap Instruments Sdn Bhd
29A, Jalan SS 15/4C,
47500 Subang Jaya,
Selangor, Malaysia.
+603-5621 5786
+603-5621 5829

Mahr Metrology - WM 100

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Mahr Metrology - WM 100 Surface Texture Measuring Instruments Dimensional Metrology System

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3D Measurement System with with light interferometer
  • Non-Contact - Easy to Use 
  • Fast Roughness Measurement 
  • Sub-nanometer - High Resolution
Features
  • Microscopic technology dedicated to the reproduction of tiny surface features up to the physical limit.
  • Video real time surface scanning technology for fast and reliable results.
  • Robust, maintenance free, long-lived construction.
  • Complete assortment of premium quality objectives available
Description
Surface scanning sensor ideally suited for fast-paced measurement of smallest to medium sized surface details, like roughness measurement in sub-nanometers. Excellent, high resolution reproduction of
even microscopic surface details.


Technical Data


Measuring principle
By interferometer, by white light interferometer
Light source (WLI): LED, 505 nm
Measuring range mm
Sensor unit can be moved manually over 200 mm in Z
Object table can be moved manually in X and Y

Interferometer, white light interferometer:
Measuring range (WLI): Up to 100 µm (vertical). More on request.
Interfaces
230 V, 50 Hz

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