Obsnap Instruments Sdn Bhd
29A, Jalan SS 15/4C,
47500 Subang Jaya,
Selangor, Malaysia.
+603-5621 5786
+603-5621 5829

Mahr Metrology - XR 20 MarWin MIT GD 120

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Mahr Metrology - XR 20 MarWin MIT GD 120 Surface Texture Measuring Instruments Dimensional Metrology System

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PC based instrument delivers all common surface parameters and profiles in accordance with international standards (both in measuring room and in production)

Combines decades of experience in surface metrology with innovative technology
    - Easy to read icons
    -User friendly operator assistance

A sampling length of up to 120 mm is possible in conjunction with the GD 120 drive unit
  • In addition to surface roughness evaluations, profile and waviness evaluations can also be performed in this way
  • Over 100 surface parameters available for R, P and W profiles in accordance with ISO / JIS, ASME or MOTIF (ISO 12085)
  • Tolerance monitoring and statistics for all surface parameters
  • Internal program assistance for quick and easy measurements
  • Comprehensive measuring records
  • Automatic functions for choosing filter and traversing length in accordance with international  standards
  • Support for various calibration methods (static/dynamic) by specifying the Ra or Rz parameter
  • Adjustable maintenance and calibration intervals
  • Simulation mode for rapid familiarization with operating principle
  • Multiple measuring station configurations for custom applications

Technical Data
Measuring principle
Stylus method
R probe, MFW 250 B
Measuring range mm
MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin)
Filter according to ISO/JIS
filter as per ISO 16610-21(replaced gaussian filter as per ISO 11562), robust gaussian filter a per ISO 16610-31
Traversing lengths
Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm*,
Measurement up to stop, variable
* Traversing length dependent on drive unit
Number n of sampling length according to ISO/JIS
1 to 50 (default: 5)
Surface parameters
Over 100 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)

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