Obsnap Instruments Sdn Bhd
29A, Jalan SS 15/4C, 47500 Subang Jaya, Selangor, Malaysia.
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Mahr Metrology - MarSurf XR 1

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Mahr Metrology - MarSurf XR 1 Surface Texture Measuring Instruments Dimensional Metrology System

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MarSurf XR 1.  The ideal instrument for a low-cost introduction to user-friendly surface metrology.
The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for innovative roughness evaluation software.

  • Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
  • Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required
  • Comprehensive measuring records
  • Teach-in methods for the rapid creation of Quick&Easy measuring programs
  • Automatic functions for choosing cut-off and traversing length in accordance with standards
  • Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter
  • Adjustable maintenance and calibration intervals
  • Multiple measuring station configurations for custom applications
  • Range of options provide system flexibility
  • Various user levels protect the device against misuse and prevent unauthorized people from using it

Technical Data
Measuring principle
Stylus method
BFW skidless system with MarSurf SD 26 drive unit and/or PHT skidded system with MarSurf RD 18 drive unit
Measuring range mm
+/- 250 µm (up to +/- 750 µm with 3x probe arm length) applies to BFW system
350 µm applies to PHT probe system
Filter according to ISO/JIS
filter as per ISO 16610-21(replaced gaussian filter as per ISO 11562), robust gaussian filter a per ISO 16610-31
Traversing lengths
MarSurf GD 26 / SD 26: Automatic; 0.56 mm*; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm,
Measurement up to stop, variable
* Traversing length dependent on  drive unit
RD 18: Automatic; 1.75 mm; 5.6 mm; 17.5 mm
Number n of sampling length according to ISO/JIS
1 to 50 (default: 5)
Measuring force (N)
0,75 mN
Surface parameters
Over 80 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)

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