Obsnap Instruments Sdn Bhd
29A, Jalan SS 15/4C,
47500 Subang Jaya,
Selangor, Malaysia.
+603-5621 5786
+603-5621 5829

Mahr Metrology - XC 2 MarWin MIT CD 120

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Mahr Metrology - XC 2 MarWin MIT CD 120 Surface Texture Measuring Instruments Dimensional Metrology System

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Your entry into precision contour measurement
  • The quick, simple and inexpensive 2D contour measuring system satisfies all demands in terms of accuracy and range of evaluation criteria
  • Consistently delivers safe and reliable results
  • Parameters that are dependent on datum elements are recalculated as soon as a datum element is changed
  • Password protected user access prevents improper use
  • Outstanding calibration processes including geometry calibration, measuring force calibration, bend compensation, etc.
  • Sturdy, rigid probes
  • Smooth running, sturdy and accurate drive unit
  • Automatic lowering and raising of the probe arm at individually adjustable speeds
  • Patented probe arm attachement for collision protection

Technical Data
In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)
In Z, relative to measuring system: 0.04 µm
Sampling angle
On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
Start of traversing length (in X)
0.2 mm
Tip radius
25 µm
Contacting speed (in Z)
0.1 to 1 mm/s
Probe arm length
175 mm, 350 mm
End of traversing length (in X)
120 mm
Positioning speed
In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s
Guide deviation
< 1 µm (over 120 mm)
Measuring speed
0.2 mm/s to 4 mm/s
Measuring range mm
(in Z) 50 mm
Traversing lengths
0.2 mm to 120 mm
Measuring force (N)
1 mN to 120 mN

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