Obsnap Instruments Sdn Bhd
29A, Jalan SS 15/4C,
47500 Subang Jaya,
Selangor, Malaysia.
+603-5621 5786
+603-5621 5829

EDX1800B XRF (RoHS Desktop Spectrometer)

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EDX1800B XRF (RoHS Desktop Spectrometer) X-Ray Fluorescence (XRF) Spectrometer Elemental Analysis

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This product is supplied by our sister company : JS Analytical Sdn Bhd 
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General Info

EDX1800B X-Ray Fluorescence Spectrometer is specifically designed for RoHS analysis and quality control. Manufacturers seeking compliance with RoHS / WEEE directive can quickly and non-destructively screen their products for Hazardous substances and ensure the safety of their products with great benefit.

Features
  • Specifically developed for RoHS testing: Lead (Pb), Mercury (Hg), Cadmium (Cd), Hexavalent Chromium and other hazardous elements
  • Automatic collimators and filters
  • Built-in SNE (Signal to Noise Enhancer)
  • Intelligent RoHS analytical software
  • Optional Plating-thickness analysis software
  • Variable non-linear regression
Application Fields
  • RoHS and Thickness measurement of metal plating
  • Manufacturers who need to comply with RoHS Directive
  • Electroplating industry
TECHNICAL SPECIFICATIONS 
Measurable elements: Sulfur ( S ) - Uranium ( U )
Limits of Detection: 1 ppm
Analysis Range: ppm up to 99.999%
Ambient temperature: 15°C-30°C
Repeatability: 0.1%
Energy Resolution: 160±5eV
Power: AC 220V ± 5V or AC 110V ± 5V. AC purified voltage power supply
Sample chamber size: 44cm x 30cm x 5cm
Size: 55cm x 41cm x 32cm
Weight: 45 kg

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